Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Physical Sciences Symposia

Surface & Subsurface Microscopy & Microanalysis in Materials & Biological Systems

Abstract

Multivariate Analysis Applications in ToF-SIMS

Nanoscale Surface and Sub-Surface Chemical Analysis of SiGe Nanowires

AES and Related Techniques for Yield Improvement, Metrology and Development Support of ULSI Circuits Manufactured in ≤ 28nm CMOS Technology

Nanoscale Organic Defect Characterization with AFM-IR

Multiplexed Biomimetic Lipid Membranes on Graphene by Dip-Pen Nanolithography

Complimentary XPS and AES Analysis of MoS3 Solid Lubricant Coatings

Chemical Characterization of Material Surfaces Using X-ray Photoelectron Spectroscopy (XPS): The Perfect Complement to Electron Microscopy Techniques

SEM, TEM, and AFM Analyses of Phase-Separated Polymer Blend Membranes for Gas Separations

Integrating 3D Surface Imaging with FIB/SEM Microscopy

Applications of Atomic Force Microscopy in Industrial Polymer Systems Lanti

The Impact of Estrogen Depletion and Drug Treatment on Type I Collagen Microstructure

Nanoscale Calorimetry Reveals Higher Stability of Cholesterol Induced Nanoscale Domains in Lipid Bilayers

Time-Resolved Nanometer Scale AFM Imaging of Antimicrobial Peptide Activity on Live Escherichia coli Cells

Mechanics of Biological Cells Studied with Atomic Force Microscopy

Multimodal Chemical and Physical Surface Characterization on a Combined AFM-MS Platform.

Molecular Imaging of Self-Assembled Rosette Nanotubes by Scanning Tunneling Microscopy

State of the Art Microanalysis Using Raman Microscopy

Characterization of Individual Nanoparticles with Nanoprojectile-SIMS

In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures

Improving Data Quality in Atom Probe Tomography

Microscopy and Microanalysis

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Volume 20 - August 2014

Physical Sciences Symposia

Surface & Subsurface Microscopy & Microanalysis in Materials & Biological Systems

Abstract