Microanalysis Society
Microanalysis Society
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- 29 July 2014, pp. 37-41
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Advances in Instrumentation Symposia
Oliver Wells Memorial Symposium on the Scanning Electron Microscope
Abstract
High Energy BSE/SE/STEM Imaging of 8 um Thick Semiconductor Interconnects
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- 27 August 2014, pp. 8-9
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Front Cover (OFC, IFC) and matter
MAM volume 20 issue s1 Cover and Front matter
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- 21 July 2014, pp. f1-f3
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In Situ Special Section
Visualization of the Coalescence of Bismuth Nanoparticles
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- 17 March 2014, pp. 416-424
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FEMMS Special Issue
The Near Edge Structure of Hexagonal Boron Nitride
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- 23 April 2014, pp. 1053-1059
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Materials Applications
Simultaneous Quantification of Indium and Nitrogen Concentration in InGaNAs Using HAADF-STEM
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- 30 September 2014, pp. 1740-1752
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EDGE Special Issue
Thickness Measurements Using Photonic Modes in Monochromated Electron Energy-Loss Spectroscopy
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- 10 March 2014, pp. 723-730
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Biological Applications
Evaluation of Agave Fiber Delignification by Means of Microscopy Techniques and Image Analysis
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- 26 August 2014, pp. 1436-1446
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FEMMS Special Issue
The Observation of Slip Phenomena in Single Crystal Fe Samples During In Situ Micro-Mechanical Testing Through Orientation Imaging
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- 25 June 2014, pp. 1060-1069
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In Situ Special Section
Investigating Processes of Nanocrystal Formation and Transformation via Liquid Cell TEM
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- 14 March 2014, pp. 425-436
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Materials Applications
Thickness and Rotational Effects in Simulated HRTEM Images of Graphene on Hexagonal Boron Nitride
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- 15 September 2014, pp. 1753-1763
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Study of Point Spread in the Aberration-Corrected Transmission Electron Microscopy
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- 07 July 2014, pp. 1447-1452
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Back Cover (OBC, IBC) and matter
MAM volume 20 issue s1 Cover and Back matter
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- 21 July 2014, pp. b1-b2
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International Metallographic Society
International Metallographic Society
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- 29 July 2014, pp. 42-46
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Advances in Instrumentation Symposia
Oliver Wells Memorial Symposium on the Scanning Electron Microscope
Abstract
Oliver Wells: My Recollections
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- 27 August 2014, pp. 10-11
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EDGE Special Issue
Mapping Chemical Disorder and Ferroelectric Distortions in the Double Perovskite Compound Sr2-xGdxMnTiO6 by Atomic Resolution Electron Microscopy and Spectroscopy
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- 01 April 2014, pp. 731-739
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Techniques, Software, and Instrumentation Development
Lateral Resolution Enhancement of Vertical Scanning Interferometry by Sub-Pixel Sampling
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- 07 January 2014, pp. 90-98
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Advances in Instrumentation Symposia
Oliver Wells Memorial Symposium on the Scanning Electron Microscope
Abstract
Improved SEM Image Resolution Through the Use of Image Restoration Techniques
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- 27 August 2014, pp. 12-13
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Materials Applications
Periodic Cation Segregation in Cs0.44[Nb2.54W2.46O14] Quantified by High-Resolution Scanning Transmission Electron Microscopy
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- 01 July 2014, pp. 1453-1462
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Atom Column Indexing: Atomic Resolution Image Analysis Through a Matrix Representation
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- 17 November 2014, pp. 1764-1771
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