Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 20 - August 2014

Physical Sciences Symposia

Advances in In-situ Microscopy

Abstract

A Dedicated In-situ Off-axis Electron Holography (S)TEM: Concept and Electron-Optical Performance.

Isotropic to Anisotropic Transition Observed in Si Nanoparticles Lithiation by in situ TEM

TEM In-Situ Electrical Testing of a FIB-prepared BaTiO3 Ceramic Base Metal Electrode Capacitor

Characterization of Sub-Nanometer Pt Cluster Formation on γ-A12O3 via Ex Situ Reductions using MEMS-Based Heating Technology

In-situ Switching of a Ferroelectric Film Through a Non-ferroelectric Layer and Direct Scanning Probe Analysis of the Same Cross Section

Electron Beam Induced Phase Transformation in Zinc Phosphate

Crystal Growth Mode Changes during Pulsed Laser Induced Rapid Solidification in Nanoscale Thin Films of Al-Cu Eutectic

In-situ Scanning Transmission Electron Microscopy Annealing Studies of Ni1-xCrx Nanocluster and Correlation with Magnetic Properties

Mineral Analyses from Laboratory to Spacecraft

Abstract

Remote-Sensing of Planetary Surface Using Infrared Spectroscopy

Nanoscale Infrared Spectroscopy:A non-Destructive Probe of Formation History in Extraterrestrial Samples

Connecting Lunar Meteorites to Source Terranes on the Moon

Electron Energy-Loss Spectroscopy of Iron Nanoparticles in Lunar Soil using an Aberration-Corrected Scanning Transmission Electron Microscope.

Mineral Analyses of Extraterrestrial Metal

Atom-Probe Tomography of Meteoritic Nanodiamonds.

Geological Applications of Atom Probe Tomography: New Information from Old Rocks

Successes and Challenges of Laser-Induced Breakdown Spectroscopy (LIBS) Applied to Chemical Analyses of Geological Samples.

Trace Element Analysis in Geochemical Systems by STEM\EDS

On the Use of Precession Electron Diffraction for Minerals Characterization: From Twinning Identification to Structure Refinement

Towards Understanding the Processes Affecting the CR Chondrite Parent Body: Coordinated Electron Microscopy Study of the Matrices of Antarctic CR Chondrites.

Maximizing Chemical and Textural Data with Minimal Sample Destruction: Computed Tomography, Wire Saws, and Electron Beams; ‘Oh, my’.

Microscopy and Microanalysis

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Volume 20 - August 2014

Physical Sciences Symposia

Advances in In-situ Microscopy

Abstract

Mineral Analyses from Laboratory to Spacecraft

Abstract