Microscopy and Microanalysis: Volume 24 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

Machine Learning and Compressive Sensing for Signal Processing and Image Reconstruction in Microscopy and Microanalysis

Abstract

Problems and Progress in Automating Electron Microscopy Segmentation

Front Cover (OFC, IFC) and matter

MAM volume 24 issue s2 Cover and Front matter

Analytical and Instrumentation Science Symposia

Machine Learning and Compressive Sensing for Signal Processing and Image Reconstruction in Microscopy and Microanalysis

Abstract

An Autonomous Microscopy Workflow for Structure Determination from Atomic-Resolution Images

Identifying Atoms in High Resolution Transmission Electron Micrographs Using a Deep Convolutional Neural Net

Pioneering the Use of Neural Network Architectures and Feature Engineering for Real-Time Augmented Microscopy and Analysis

Real-time Image Processing and Restoration Prototype for the SEM: Initial Steps

Tricky Registration for Unruly Data: Image Registration of Low-Signal-to-Noise Cryo-STEM Data

Machine Learning Powered Image Segmentation

Reducing the Learning Population Size for Morphological Classification of Natural Materials: Example of Gold Grains from Backscattered Electron Images

Coupling of First Principles and Machine Learning for High Throughput Calculation of Evaporation Fields

Machine Learning for Atomic Scale Chemical and Morphological Assessment

Extended High Efficiency Computed Tomography with Optimized Recursions

Deep Convolutional Neural Network Approach as a Universal Tool for Determination of Local 3D Structure from ABF STEM Images of Perovskitesy

Dragonfly as a Platform for Easy Image-based Deep Learning Applications

Data Analytics and Model-based Imaging for Microstructure and Physical Property Interpretations

Abstract

Atomic Manipulation on a Scanning Transmission Electron Microscope Platform using Real-Time Image Processing and Feedback

Custom Scan Control and Time Resolved Signal Acquisition for High Resolution SEM Imaging

Rapid Atomic-Resolution Image Analysis: Towards Near-Instant Feedback

Towards Real Time Quantitative Analysis of Supported Nanoparticle Ensemble Evolution Investigated by Environmental TEM

Metallic Copper Clusters Decorating Cu Ferrites Revealed by Deep Data Analysis

Dynamic Determination of Phase Diagrams by Active Machine Learning

Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

Machine Learning and Compressive Sensing for Signal Processing and Image Reconstruction in Microscopy and Microanalysis

Abstract

Front Cover (OFC, IFC) and matter

Analytical and Instrumentation Science Symposia

Machine Learning and Compressive Sensing for Signal Processing and Image Reconstruction in Microscopy and Microanalysis

Abstract

Data Analytics and Model-based Imaging for Microstructure and Physical Property Interpretations

Abstract