Microscopy and Microanalysis: Volume 18 -

FIB/TEM Investigation of crystallographic defects in type-II superlattice based infrared detectors
N. Bassim, A. Aifer, E. Jackson, J. Nolde, C. Affouda, C. Canedy, I. Vurgaftman, J. Meyer, S. Maximenko
Published online by Cambridge University Press:

23 November 2012, pp. 1806-1807
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Strain Analysis of Compositionally Tailored Interfaces in InAs/GaSb Superlattices by Aberration Corrected Transmission Electron Microscopy
K. Mahalingam, H.J. Haugan, G.J. Brown, K.G. Eyink
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23 November 2012, pp. 1808-1809
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Scanning Probe Microscopy Based Characterizations of III-V Semiconductor Quantum Well Devices
M. Yakes, N. Mahadik, S.B. Qadri, E.H. Aifer, I. Vurgaftman, J.R. Meyer, A.R. Laracuente
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23 November 2012, pp. 1810-1811
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Charge Redistribution at ‘Polytype’ Heterojunctions in InAs(Sb) Nanopillars
L. Li, Z. Gan, H. Liang, H. Yu, D. Smith, M. Martha
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23 November 2012, pp. 1812-1813
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Origins of Electronic States in Semiconductor Nanostructures
R. Goldman
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23 November 2012, pp. 1814-1815
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Cross-Sectional Characterization of Defects in GaN MQW LEDs
A. Boley, I. Tsong, D.J. Smith
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23 November 2012, pp. 1816-1817
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Temperature dependence of Z-Contrast for InGaN
T. Mehrtens, M. Schowalter, A. Rosenauer, D. Tytko, P. Choi, D. Raabe, L. Hoffmann, A. Hangleiter
Published online by Cambridge University Press:

23 November 2012, pp. 1818-1819
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Measurement of Indium-Content Variation in InGaN/GaN Dot-in-a-Wire Nanostructures by Electron Energy-Loss Spectroscopy
S.Y. Woo, N. Gauquelin, G.A. Botton, S. Turner, Z. Mi
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23 November 2012, pp. 1820-1821
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Growth Mechanisms and Electronic Structure of Embedded ErAs and ErSb Nanostructures Studied by In-Situ Scanning Tunneling Microscopy
J. Kawasaki, B.D. Schultz, C.J. Palmstrom
Published online by Cambridge University Press:

23 November 2012, pp. 1822-1823
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantum confinement of Si nanocrystals in Si-rich nitrides
P.D. Nguyen, A. Olsen, D. Kepaptsoglou, Q. Ramasse
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23 November 2012, pp. 1824-1825
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Mapping the Electrostatic Profile Across Axial p-n Junctions in Si nanowires using Off-Axis Electron Holography
Z. Gan, D.J. Smith, M.R. McCartney, D.E. Perea, S.T. Picraux
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23 November 2012, pp. 1826-1827
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Aberration Corrected HAADF-STEM of Ultrasmall Erbium Silicide Nanowires
J. Mitchell, S. Tear, J. Yuan
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23 November 2012, pp. 1828-1829
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Dynamics and White Light Emission from CdSe Nanocrystals
J.R. McBride, S.J. Rosenthal, S.T. Pantelides, S.J. Pennycook, T.J. Pennycook
Published online by Cambridge University Press:

23 November 2012, pp. 1830-1831
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantifying polarization fields and sheet charge in III-nitride HEMT devices using off-axis electron holography
M.R. Johnson, D.J. Smith, L. Zhou, M.R. McCartney, D.A. Cullen
Published online by Cambridge University Press:

23 November 2012, pp. 1832-1833
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Cathodoluminescence directly performed in a transmission electron microscope: nanoscale correlation of structural and optical properties
J. Christen, F. Bertram, G. Schmidt, P. Veit, S. Petzold, R. Ravash, A. Dadgar, A. Krost
Published online by Cambridge University Press:

23 November 2012, pp. 1834-1835
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microcharacterization of GaN Nanomembranes Using Cathodoluminescence Microanalysis.
M.A. Stevens-Kalceff, I.M. Tiginyanu
Published online by Cambridge University Press:

23 November 2012, pp. 1836-1837
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Direct imaging of GaN Pyramids covered by InGaN Single Quantum Well using nano-scale Scanning Transmission Electron Microscopy Cathodoluminescence
M. Müller, G. Schmidt, S. Metzner, F. Bertram, S. Petzold, P. Veit, J. Christen, C. Wächter, M. Jetter, P. Michler
Published online by Cambridge University Press:

23 November 2012, pp. 1838-1839
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterization of optical properties of the dislocations in GaN films using transmission electron microscopy cathodoluminescence
S. Kim, J. Lee, B. Koo, Y. Kim, J. Choi, S. Kwon
Published online by Cambridge University Press:

23 November 2012, pp. 1840-1841
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

STEM Analysis Of Cu(Mn) Self-Forming Diffusion Barriers on SiO2 For Applications In The Semiconductor Industry
J.G. Lozano, P. Nellist, J. Bogan, P. Casey, A. McCay, G. Hughes
Published online by Cambridge University Press:

23 November 2012, pp. 1842-1843
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantifying Octahedral Rotations in Ultrathin LaNiO3 Films Using Position Averaged Convergent Beam Electron Diffraction
J. Hwang, J.Y. Zhang, J. Son, S. Stemmer
Published online by Cambridge University Press:

23 November 2012, pp. 1844-1845
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microscopy and Microanalysis

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Volume 18 - October 2012

Physical Science Symposium

Microscopy and Analysis of Quantum Structures and Devices-01

Research Article

FIB/TEM Investigation of crystallographic defects in type-II superlattice based infrared detectors

Strain Analysis of Compositionally Tailored Interfaces in InAs/GaSb Superlattices by Aberration Corrected Transmission Electron Microscopy

Scanning Probe Microscopy Based Characterizations of III-V Semiconductor Quantum Well Devices

Microscopy and Analysis of Quantum Structures and Devices-02

Research Article

Charge Redistribution at ‘Polytype’ Heterojunctions in InAs(Sb) Nanopillars

Origins of Electronic States in Semiconductor Nanostructures

Cross-Sectional Characterization of Defects in GaN MQW LEDs

Temperature dependence of Z-Contrast for InGaN

Measurement of Indium-Content Variation in InGaN/GaN Dot-in-a-Wire Nanostructures by Electron Energy-Loss Spectroscopy

Microscopy and Analysis of Quantum Structures and Devices-03

Research Article

Growth Mechanisms and Electronic Structure of Embedded ErAs and ErSb Nanostructures Studied by In-Situ Scanning Tunneling Microscopy

Quantum confinement of Si nanocrystals in Si-rich nitrides

Mapping the Electrostatic Profile Across Axial p-n Junctions in Si nanowires using Off-Axis Electron Holography

Aberration Corrected HAADF-STEM of Ultrasmall Erbium Silicide Nanowires

Dynamics and White Light Emission from CdSe Nanocrystals

Microscopy and Analysis of Quantum Structures and Devices-04

Research Article

Quantifying polarization fields and sheet charge in III-nitride HEMT devices using off-axis electron holography

Cathodoluminescence directly performed in a transmission electron microscope: nanoscale correlation of structural and optical properties

Microcharacterization of GaN Nanomembranes Using Cathodoluminescence Microanalysis.

Direct imaging of GaN Pyramids covered by InGaN Single Quantum Well using nano-scale Scanning Transmission Electron Microscopy Cathodoluminescence

Characterization of optical properties of the dislocations in GaN films using transmission electron microscopy cathodoluminescence

Microscopy and Analysis of Quantum Structures and Devices-05

Research Article

STEM Analysis Of Cu(Mn) Self-Forming Diffusion Barriers on SiO2 For Applications In The Semiconductor Industry

Quantifying Octahedral Rotations in Ultrathin LaNiO3 Films Using Position Averaged Convergent Beam Electron Diffraction

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 18 - October 2012

Physical Science Symposium

Microscopy and Analysis of Quantum Structures and Devices-01

Research Article

Microscopy and Analysis of Quantum Structures and Devices-02

Research Article

Microscopy and Analysis of Quantum Structures and Devices-03

Research Article

Microscopy and Analysis of Quantum Structures and Devices-04

Research Article

Microscopy and Analysis of Quantum Structures and Devices-05

Research Article