Microscopy and Microanalysis: Volume 18 -

Dynamical Simulation of Electron Backscatter Diffraction (EBSD) Patterns of Imperfect Crystals.
G. Nolze, A. Winkelmann
Published online by Cambridge University Press:

23 November 2012, pp. 1246-1247
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Enhanced Quantitative Characterization Of Textured Al-doped ZnO Thin Films Using Plan-view Electron Diffraction
J. Wang
Published online by Cambridge University Press:

23 November 2012, pp. 1248-1249
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Phase Reconstruction Of Electron Waves Using Diffractive Imaging
J. Yamasaki, N. Tanaka, K. Ota, S. Morishita, H. Sasaki
Published online by Cambridge University Press:

23 November 2012, pp. 1250-1251
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Identifying Nanostructure in Metallic Glasses using Electron Cross-Correlation Analysis
S.N. Bogle, M. Rasshchupkyna, V. Bugaev, M. Castro-Colin, P. Wochner
Published online by Cambridge University Press:

23 November 2012, pp. 1252-1253
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Developments in EBSD Pattern Background Removal, Band Detection and Indexing for Improved Data Quality and Ease of Use
J. Goulden, N.H. Schmidt, H.U. Singh, S.D. Sitzman
Published online by Cambridge University Press:

23 November 2012, pp. 1254-1255
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Fast periodicity-analysis with “4spots” and ImageJ
R.W. Collins, P. Sheehan, M. Higley, P. Fraundorf, D. Osborn
Published online by Cambridge University Press:

23 November 2012, pp. 1256-1257
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Application of Selected Diffraction with STEM to some materials
Y. Suzuki, Y. Kuroda, H. Kikuchi, K. Nakamura
Published online by Cambridge University Press:

23 November 2012, pp. 1258-1259
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Orthogonal random layer lattices or random offset phase transition?
R.W. Collins, P. Fraundorf, P. Sheehan, D. Osborn
Published online by Cambridge University Press:

23 November 2012, pp. 1260-1261
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Software Design for Simulation and Analysis of Electron Diffraction Patterns
X. Li
Published online by Cambridge University Press:

23 November 2012, pp. 1262-1263
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Analysis Of Gas Flow In The New System Of Apertures In The Secondary Electron Scintillation Detector For ESEM
J. Maxa, J. Jirak, V. Nedela
Published online by Cambridge University Press:

23 November 2012, pp. 1264-1265
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Scintillation Secondary Electron Detector For ESEM And SEM
J. Jirak, P. Cudek, V. Nedela
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23 November 2012, pp. 1266-1267
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Comparative Study Of Human Embryonic Stem Cell Surface Structure Using SEM And ESEM
E. Flodrova, V. Nedela, A. Hampl, M. Sedlackova
Published online by Cambridge University Press:

23 November 2012, pp. 1268-1269
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Environmental Scanning Electron Microscope As A Tool For Imaging Of Native State Somatic Embryogenesis
V. Nedela, J. Runstuk, S. Svidenska, J. Hrib, B. Vookova
Published online by Cambridge University Press:

23 November 2012, pp. 1270-1271
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Variable-Pressure Scanning Electron Microscopy: Dark Horse of SEM imaging
L. Joubert
Published online by Cambridge University Press:

23 November 2012, pp. 1272-1273
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Novel Correlative Imaging and Chemical Analysis Methods Used From Cancer Research to the Search for Natural Energy Resources
D. Guarrera, N. Erdman, V. Robertson
Published online by Cambridge University Press:

23 November 2012, pp. 1274-1275
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Analytical Transmission Electron Microscopy in the Third Dimension
A. Genc, H. Cheng, J.P. Winterstein, L. Pullan, B. Freitag
Published online by Cambridge University Press:

23 November 2012, pp. 1276-1277
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Exploring new frontiers with the Nion aberration-corrected STEM
N.J. Bacon, G.J. Corbin, N. Dellby, P. Hrncirik, N. Kurz, T.C. Lovejoy, M.F. Murfitt, G.S. Skone, Z.S. Szilagyi, O.L. Krivanek
Published online by Cambridge University Press:

23 November 2012, pp. 1278-1279
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Development of STEM for the HT7700 TEM and Optimization of Digital-Image Detectors Arrangement
T. Hashimoto, S. Mamishin, A. Mouri, A. Watabe, M. Kondo, M. Okada, T. Wada, H. Mise, T. Oyagi, T. Yotsuji, Y. Nodera, E. Nakazawa
Published online by Cambridge University Press:

23 November 2012, pp. 1280-1281
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Monochromatic non-immersion FEG SEM
D. Phifer, P. Wandrol, B. Sed'a, P. Dostál, J. Pavliš, T. Janočko, T. Vystavěl, L. Tuma, M. Castagna
Published online by Cambridge University Press:

23 November 2012, pp. 1282-1283
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Advanced technologies for charge mitigation on non conductive samples
D.C. Wall, E. Bosch, S. Sluyterman, P. Wandrol
Published online by Cambridge University Press:

23 November 2012, pp. 1284-1285
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Volume 18 - October 2012

Instrumentation Symposium

Electron Diffraction-01

Research Article

Dynamical Simulation of Electron Backscatter Diffraction (EBSD) Patterns of Imperfect Crystals.

Enhanced Quantitative Characterization Of Textured Al-doped ZnO Thin Films Using Plan-view Electron Diffraction

Phase Reconstruction Of Electron Waves Using Diffractive Imaging

Identifying Nanostructure in Metallic Glasses using Electron Cross-Correlation Analysis

Developments in EBSD Pattern Background Removal, Band Detection and Indexing for Improved Data Quality and Ease of Use

Electron Diffraction-02

Research Article

Fast periodicity-analysis with “4spots” and ImageJ

Application of Selected Diffraction with STEM to some materials

Orthogonal random layer lattices or random offset phase transition?

Software Design for Simulation and Analysis of Electron Diffraction Patterns

VPSEM / ESEM-04

Research Article

Analysis Of Gas Flow In The New System Of Apertures In The Secondary Electron Scintillation Detector For ESEM

Scintillation Secondary Electron Detector For ESEM And SEM

Comparative Study Of Human Embryonic Stem Cell Surface Structure Using SEM And ESEM

Environmental Scanning Electron Microscope As A Tool For Imaging Of Native State Somatic Embryogenesis

Variable-Pressure Scanning Electron Microscopy: Dark Horse of SEM imaging

Vendor Symposium-01

Research Article

Novel Correlative Imaging and Chemical Analysis Methods Used From Cancer Research to the Search for Natural Energy Resources

Analytical Transmission Electron Microscopy in the Third Dimension

Exploring new frontiers with the Nion aberration-corrected STEM

Development of STEM for the HT7700 TEM and Optimization of Digital-Image Detectors Arrangement

Monochromatic non-immersion FEG SEM

Advanced technologies for charge mitigation on non conductive samples

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 18 - October 2012

Instrumentation Symposium

Electron Diffraction-01

Research Article

Electron Diffraction-02

Research Article

VPSEM / ESEM-04

Research Article

Vendor Symposium-01

Research Article