Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

Role of Fluid-Mediated Interactions in Guiding Nanoparticle Assembly

The Two Dimensional Nanoplate Dynamics Revealed by in situ Liquid Cell TEM

Dynamic studies of solution-based reactions using operando TEM

Precision In Situ Control of Local Liquid Chemistry via Electron Irradiation

Probing Nanoparticle Dynamics in 200 nm Thick Liquid Layers at Millisecond Time Resolution

Bonding Pathways of Gold Nanocrystals in Solution

Electron Beam Induced Domain Motion in Ferroelectric RKTP Observed By Transmission Electron Microscopy

In Situ Analysis of the Fracture Behavior of Nanocrystalline Copper Using Precession-Assisted Crystal Orientation Mapping

P06 Failure Analysis Applications of Microanalysis, Microscopy, Metallography, and Fractography

Abstract

Observation of the Potential Distribution in GaN-Based Devices by a Scanning Electron Microscope

Denickelification and Dezincification of Copper Alloys in Water Environments

Application of EFTEM and XEDS Elemental Mapping to Characterization of Nanometer Devices in Semiconductor Wafer-Foundries

Isolating the Photocatalytic Degradation of Methylene Blue Dye on TiO2 Surface

Influence of Hydrogen on Fracture Mode API X60 Steel

Electron Energy-Loss Spectroscopy (EELS) Study of NbOx Film for Resistive Memory Applications

Microscopic Origin of Strength and Microhardness of Titanium Alloy at Elevated Temperature

P08 Microscopy and Characterization of Ceramics, Polymers and Composites

Abstract

Microstructural Properties of Piezoelectric 0.95(Naoo5Bioo5TiO3)-0.05(BaTiO3) Thin Films on SrTiO3 (001) Substrates

TEM Study of Nano Crystals in Li2O-Al2O3-SiO2 Glass-Ceramics

A New Method to Characterize Non-oxide Thin Film Uniformity at Device Level using Electron Energy Loss Spectroscopy

The Influence of pH Buffer as Agent Reaction Moderator in the Growth of CdS/ZnS Films by CBD Technique for Solar Cell Applications

Pressure Effect on the Deposition in the a-Si:H Films by PECVD Process for Solar Cell Applications

Microscopy and Microanalysis

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Volume 21 - August 2015

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

P06 Failure Analysis Applications of Microanalysis, Microscopy, Metallography, and Fractography

Abstract

P08 Microscopy and Characterization of Ceramics, Polymers and Composites

Abstract