Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract

Z-Contrast Imaging of Dislocation Cores at the Si/GaAs Interface

The Study of Intergranular Segregation and Elemental Partitioning in Partially Molten Olivine-bearing Geological Composites by STEM-EDX

Nanobelt Thickness and Mean-free Path Determination by CBED and PEELS

EFTEM and its Application in Cryo Electron Microscopy

The Optimization of EDX Performance in Tecnai TEMs

Imaging Single Dopant Atoms and Nanoclusters in Highly n-type Bulk Si

Multi-Electrode Samples for TEM Studies of Corrosion

Structure Characterization of ZnSe/GaMnAs Quantum Well on GaAs Substrate

Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract