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The Optimization of EDX Performance in Tecnai TEMs

Published online by Cambridge University Press:  01 August 2002

H.S. von Harrach ,
B. Freitag ,
W. Gerits ,
E. van Cappellen  and
A. Sandborg
H.S. von Harrach
Affiliation:
FEI Electron Optics, P.O. Box 218, 5600KE Eindhoven, The Netherlands
B. Freitag
Affiliation:
FEI Electron Optics, P.O. Box 218, 5600KE Eindhoven, The Netherlands
W. Gerits
Affiliation:
FEI Electron Optics, P.O. Box 218, 5600KE Eindhoven, The Netherlands
E. van Cappellen
Affiliation:
FEI Electron Optics, P.O. Box 218, 5600KE Eindhoven, The Netherlands
A. Sandborg
Affiliation:
Edax Inc, 91 McKee Drive, Mahwah, NJ 07430 USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1612 - 1613
Copyright
Copyright © Microscopy Society of America 2002