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Volume 17 - February 2011

Contents

Page 24 of 58

Instrumentation and Techniques

Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing

Abstract

  • Addressing Accurate Trace Element Analysis at High Spatial Resolution in EPMA

  • M Jercinovic, M Williams, J Allaz, J Donovan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 576-577
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Improving EPMA Analyses Using Mean Atomic Number Backgrounds

  • D Wark, J Donovan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 580-581
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Advances in Electron-probe Microanalysis and Problem-Solving Approaches Using Microanalysis Tools

  • P Carpenter
  • Published online by Cambridge University Press:
    08 April 2017, pp. 582-583
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Historical Development of the Cameca EPMA

  • D Snoeyenbos, M Outrequin
  • Published online by Cambridge University Press:
    08 April 2017, pp. 584-585
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • 50 Years of JEOL Electron Probe Micro Analyzer

  • H Takahashi
  • Published online by Cambridge University Press:
    09 April 2017, pp. 586-587
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Beam Sensitivity in EPMA: The Analysis of Apatite, Ca5(PO4)3(F,Cl,OH)

  • C Henderson
  • Published online by Cambridge University Press:
    08 April 2017, pp. 588-589
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • On the Performance of XEDS and EELS in the AEM: 25 Years Later

  • H Fraser, D Klenov, Y-C Wang, H Cheng, N Zaluzec
  • Published online by Cambridge University Press:
    08 April 2017, pp. 590-591
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials

  • D Meier, J Davis, A Konicek, E Vicenzi, S Wight
  • Published online by Cambridge University Press:
    08 April 2017, pp. 592-593
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Multivariate Statistical Analysis of STEM-EDS at the Noise Floor

  • C Parish, P Edmondson, M Miller
  • Published online by Cambridge University Press:
    08 April 2017, pp. 594-595
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • High Resolution Imaging and X-Ray Microanalysis in the FE-SEM

  • R Gauvin, N Brodusch, P Michaud, L Rodrigue, M Trudeau
  • Published online by Cambridge University Press:
    08 April 2017, pp. 596-597
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Chemical Mapping at the Atomic Level using Energy Dispersive X-ray Spectroscopy

  • D Klenov, B Freitag, H von Harrach, A D'Alfonso, L Allen
  • Published online by Cambridge University Press:
    08 April 2017, pp. 598-599
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM

  • V-D Hodoroaba, T Salge, R Terborg, V Rackwitz
  • Published online by Cambridge University Press:
    08 April 2017, pp. 600-601
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • X-ray Microanalysis Artifacts Visualized

  • V Dusevich, J Melander, J Eick
  • Published online by Cambridge University Press:
    09 April 2017, pp. 606-607
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Sample Rotation: A Mechanical Method to Compensate for Irregular Sample Geometry during Electron Probe Microanalysis of Particles

  • C Schwandt
  • Published online by Cambridge University Press:
    08 April 2017, pp. 608-609
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • High Current Electron-probe Microanalysis of Ni and Co in Olivine in the NWA 773 Lunar Meteorite Clan

  • K Gibson, B Jolliff, P Carpenter
  • Published online by Cambridge University Press:
    08 April 2017, pp. 610-611
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Three-Dimensional Electron Microscopy Simulation with the CASINO Monte Carlo Software

  • H Demers, N Poirier-Demers, N de Jonge, D Drouin
  • Published online by Cambridge University Press:
    08 April 2017, pp. 612-613
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Instrumental Performance Parameters for Specification and Check of Energy Dispersive X-Ray Spectrometers as in the International Standard ISO 15632

  • V-D Hodoroaba
  • Published online by Cambridge University Press:
    08 April 2017, pp. 614-615
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 24 of 58