Instrumentation and Techniques
Focused Ion Beam (FIB) Science and Technology: Fundamental Interactions,Instrumentation and Applications
Abstract
Applications for Argon in a Triple Beam
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 322-323
-
- Article
-
- You have access
- Export citation
Surface Area Determination of Metal Ceramic Composite by FIB Sectioning and BET Measurements
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 324-325
-
- Article
-
- You have access
- Export citation
Experimental Determination of Electron Inelastic Mean Free Path of Components in a Magnetic Read Head
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 326-327
-
- Article
-
- You have access
- Export citation
Focused Ion Beam as a Direct-write Mask Tool for Patterning Diamond
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 328-329
-
- Article
-
- You have access
- Export citation
Precision, Double XTEM Sample Preparation of Site Specific Si Nanowires
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 330-331
-
- Article
-
- You have access
- Export citation
Advantages of a Local Charge Compensation System for FIB/SEM Applications on Insulating Materials
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 332-333
-
- Article
-
- You have access
- Export citation
Backside TEM Sample Preparation With The Multi-Loader Flip-Stage
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 334-335
-
- Article
-
- You have access
- Export citation
Protective Carbon Deposition for Superior FIB Prepared (S)TEM Specimens
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 336-337
-
- Article
-
- You have access
- Export citation
Dislocation Analysis of Semiconductor Devices using 3D Rotation Imaging Technique of Dedicated STEM
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 338-339
-
- Article
-
- You have access
- Export citation
Standard Free Thickness Determination of Thin TEM Samples via Backscatter Electron Image Correlation
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 340-341
-
- Article
-
- You have access
- Export citation
Towards Low-Damage TEM Sample Preparation of Carbonaceous Materials in the Focused Ion Beam
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 342-343
-
- Article
-
- You have access
- Export citation
Applications of SEM/FIB Technology in Life Science
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 344-345
-
- Article
-
- You have access
- Export citation
Focused Ion Beam-based Three Dimensional Analysis of Optic Nerve Axons
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 346-347
-
- Article
-
- You have access
- Export citation
Nanomilling for Aberration – Corrected TEM and HAADF STEM
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 348-349
-
- Article
-
- You have access
- Export citation
Toward Nanomagnetomechanical Systems Focused Ion Beam Milling of Ferromagnetic Garnets
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 350-351
-
- Article
-
- You have access
- Export citation
TEM Characterization of Deformation and Failure Mechanisms in 40 nm and 5nm Cu/Nb Nanolayed Micro Compression Pillars
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 352-353
-
- Article
-
- You have access
- Export citation
FIB/SEM Fabrication of Nanostructures for Plasmonic Sensors and Waveguides
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 354-355
-
- Article
-
- You have access
- Export citation
Nanofabrication of Multi-Layer Devices and Multiple Writing Fields Using Focused Ion Beam and DualBeam™ Instruments
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 356-357
-
- Article
-
- You have access
- Export citation
Damage Layers in Si vs. Ion Dose during 30 keV FIB Milling
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 358-359
-
- Article
-
- You have access
- Export citation
Optimized Sample Preparation for the Imaging of Silicon Defects using Plan View Transmission Electron Microscopy
-
- Published online by Cambridge University Press:
- 26 July 2009, pp. 360-361
-
- Article
-
- You have access
- Export citation