Microscopy and Microanalysis: Volume 27 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Microscopy & Spectroscopy of Energy Conversion and Storage Materials

Understanding Degradation Processes in MXene Anodes by In-situ Liquid Cell STEM

Structural Investigation of NCM-Cathode-LLZO-Electrolyte Composites as Promising Candidates for All-Solid-State Batteries Using (Cryo) STEM and PED

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

From Convergent Beam Electron Diffraction to 4D-STEM: New opportunities for revealing structure at the atomic scale

Comparison Between Moiré Sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis Strain Characterization Method and Dark-Field Electron Holography

Crystal Lattices Reconstruction from Moiré Aliased Scanning Transmission Electron Microscopy Electron Micrograph

Studying clustering in Al alloys by 4D-STEM

Dose-efficient strain mapping with high precision and throughput using cepstral transforms on 4D-STEM data

Microscopy and Microanalysis for Real World Problem Solving

Understanding moisture-induced mesopore formation in metal organic framework Cu3(btc)2 using three-dimensional FIB/SEM analysis

Impact of Network Architecture on the Microstructure of PDMS/PMMA Hybrid Elastomers

Analysis of the profile roughness of core-shell microparticles by electron microscopy

Multimodal Characterization of Hierarchically Porous Nanocomposite Materials: The Case Study of the PEARL Membrane

Migration of Erucamide in Polyethylene Films at Elevated Temperatures

The Influence of Interfacial Chemistry on Bonding During High-velocity Impact of Microparticles

Advances in Analytical STEM-in-SEM

Methods of the electron induced cleanning in SEM

Challenges and perspectives of Transmission Kikuchi Diffraction for nanocrystalline materials characterization

Determining Lattice Parameters by Curve-Fitting Transmission Kikuchi Diffraction Patterns

Quantification and Mitigation of Electron-Beam-Induced Carbon Contamination

Vendor Symposium

The novel approach to correlative microscopy using AFM-in-SEM and CPEM technology

3D Correlative Microscopy for Real World Problem Solving

Safe and Quantitative Analysis of Nuclear Materials From the Milli to Nano-Scale

Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Microscopy & Spectroscopy of Energy Conversion and Storage Materials

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Microscopy and Microanalysis for Real World Problem Solving

Advances in Analytical STEM-in-SEM

Vendor Symposium