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The Role of Electron Microscopy in the Development of Monodisperse Cubic Iron Oxide Nanoparticles as Certified Reference Material for Size and Shape

Published online by Cambridge University Press:  22 July 2022

Paul Mrkwitschka ,
Sarah-Luise Abram ,
Andreas Thünemann ,
Bastian Rühle ,
Jörg Radnik ,
Harald Bresch ,
Ute Resch-Genger  and
Vasile-Dan Hodoroaba
Paul Mrkwitschka*
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Sarah-Luise Abram*
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Andreas Thünemann
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Bastian Rühle
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Jörg Radnik
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Harald Bresch
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Ute Resch-Genger
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Vasile-Dan Hodoroaba
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
*
*Corresponding authors: paul.mrkwitschka@bam.de and sarah-luise.abram@bam.de
*Corresponding authors: paul.mrkwitschka@bam.de and sarah-luise.abram@bam.de

Abstract

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Type
On Demand - Science Of Metrology With Electrons
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 802 - 805
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Copyright
Copyright © Microscopy Society of America 2022

References

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Acknowledgement BAM focus area project nanoplatform (www.bam.de/Content/EN/Projects/nanoPlattform/nanoplattform.html) for funding the work. Sigrid Benemann is thanked for her contribution to SEM imaging.Google Scholar