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Reproducible lamella preparation for electron cryo-tomography by in-situ thickness estimation during fluorescence-guided FIB milling

Published online by Cambridge University Press:  22 July 2022

Radim Skoupy ,
Daan B. Boltje ,
Jacob P. Hoogenboom  and
Arjen J. Jakobi
Radim Skoupy*
Affiliation:
Department of Bionanoscience, Kavli Institute of Nanoscience Delft University of Technology, Delft, The Netherlands Department of Imaging Physics, Delft University of Technology, Delft, The Netherlands
Daan B. Boltje
Affiliation:
Department of Imaging Physics, Delft University of Technology, Delft, The Netherlands Delmic B.V., Delft, The Netherlands
Jacob P. Hoogenboom
Affiliation:
Department of Imaging Physics, Delft University of Technology, Delft, The Netherlands
Arjen J. Jakobi
Affiliation:
Department of Bionanoscience, Kavli Institute of Nanoscience Delft University of Technology, Delft, The Netherlands
*
*Corresponding author: R.Skoupy@tudelft.nl

Abstract

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Type
Technical Advances in Cryo-EM
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1210 - 1211
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Copyright
Copyright © Microscopy Society of America 2022

References

Wagner, F.R. et al. , Nature Protocols 15 (2020), 2041–2070. doi:10.1038/s41596-020-0320-xCrossRefGoogle Scholar
Boltje, D. et al. , ENZEL – A cryogenic, coincident fluorescence, electron, and ion beam solution for the cryo-electron tomography workflow, Microscopy and Microanalysis 27 (Suppl S1) pp. 3228 - 3229 (2021) doi: 10.1017/S1431927621011120CrossRefGoogle Scholar
Chewpraditkul, W. et al. , Optical Materials 35 (2013). doi:10.1016/j.optmat.2013.04.024Google Scholar
Skoupy, R. and Krzyzanek, V., Microscopy and Microanalysis 27 (Suppl 1) (2021), 1602. doi: 10.1017/S1431927621005894CrossRefGoogle Scholar
The authors acknowledge funding from the Applied and Engineering Sciences domain of the Netherlands Organization for Scientific Research – (NWO-TTW project no. 17152)Google Scholar