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Probing Atom Dynamics in Excited Nanocrystals

Published online by Cambridge University Press:  22 July 2022

Fu-Rong Chen ,
Dirk Van Dyck ,
Christian Kisielowski ,
Bastian Barton ,
Lars P. Hansen  and
Stig Helveg
Fu-Rong Chen
Affiliation:
Department of Materials Science and Engineering, City University of Hong Kong, Kowloon Tong, Hong Kong, SAR.
Dirk Van Dyck
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium
Christian Kisielowski
Affiliation:
The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA
Bastian Barton
Affiliation:
The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA
Lars P. Hansen
Affiliation:
Haldor Topsoe A/S, Kgs. Lyngby, Denmark
Stig Helveg*
Affiliation:
Center for Visualizing Catalytic Processes (VISION), Technical University of Denmark, Kgs. Lyngby, Denmark
*
*Corresponding author: stig@fysik.dtu.dk

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2128 - 2129
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Copyright
Copyright © Microscopy Society of America 2022

References

Chen, F.-R., Van Dyck, D., Kisielowski, C., Hansen, L.P., Barton, B., Helveg, S., Nature Commun. 12 (2021), p. 5007. doi:10.1038/s41467-021-24857Google Scholar
Chen, F.-R., Van Dyck, D., Kisielowski, C., Nature Commun. 7 (2016), p. 10603. doi: 10.1038/s41467-021-24857-4Google Scholar
Helveg, S., Kisielowski, C.F., Jinschek, J. R., Specht, P., Yuan, G., Frei, H., Micron 68 (2014), 176. doi: 10.1016/j.micron.2014.07.009Google Scholar
Zhu, Y., Ramasse, Q.M., Brorson, M., Moses, P.G., Hansen, L.P., Kisielowski, C.F., Helveg, S., Angew. Chem. Int. Ed. 53 (2014), p. 10723. doi: 10.1002/anie.201405690Google Scholar