Hostname: page-component-848d4c4894-v5vhk Total loading time: 0 Render date: 2024-06-17T15:42:35.283Z Has data issue: false hasContentIssue false
  • English
  • Français

Metrology of Sample Preparation for Electron Microscopy: Application to Strain Measurements

Published online by Cambridge University Press:  22 July 2022

Pawel Nowakowski ,
Mary Ray  and
Paul Fischione
Pawel Nowakowski*
Affiliation:
E.A. Fischione Instruments, Inc. Export, PA U.S.A
Mary Ray
Affiliation:
E.A. Fischione Instruments, Inc. Export, PA U.S.A
Paul Fischione
Affiliation:
E.A. Fischione Instruments, Inc. Export, PA U.S.A
*
*Corresponding author: p_nowakowski@fischione.com

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Science of Metrology with Electrons
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 768 - 770
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Margulies, L, Winther, G, Poulsen, HF, Science 291(5512) (2001), p. 2392–2394. doi:10.1126/science.1057956CrossRefGoogle Scholar
Wilkinson, A, Dingley, D, Acta Metallurgica Et Materialia, 39(12) (1991), p. 3047–3055. doi:10.1016/0956-7151(91)90037-2CrossRefGoogle Scholar
Kaboli, S, Goldbaum, D, Chromik, R, Gauvin, R, Microscopy and Microanalysis, 19(6) (2013), p. 1620–1631. doi:10.1017/s1431927613013469CrossRefGoogle Scholar
Nguyen, V, Kwon, S, Kwon, O, Kim, Y, Procedia Engineering, 184 (2017), p. 381–389. doi:10.1016/j.proeng.2017.04.108CrossRefGoogle Scholar
Rodríguez-Martínez, J, Rusinek, A, Pesci, R, Zaera, R, EPJ Web of Conf., 26 (2012), p. 04036. doi:10.1051/epjconf/20122604036CrossRefGoogle Scholar
Klostermann, J, Burgers, W, Acta Metall., 12(4) (1964), p. 355–360. doi:10.1016/0001-6160(64)90004-5CrossRefGoogle Scholar
Nowakowski, P, Schlenker, J, Ray, M, Fischione, P, Microscopy and Microanalysis, 22(S3) (2016), p. 12–13. doi:10.1017/S143192761600091XCrossRefGoogle Scholar
Michael, J, Giannuzzi, L, Burke, M, Zhong, X, Microscopy and Microanalysis (2021), p. 1–13. doi:10.1017/S1431927621013738Google Scholar