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In-situ TEM Laser Heating for Manipulation of Cooling Rates and Observation of Precipitate Dissolution Kinetics

Published online by Cambridge University Press:  22 July 2022

Kathryn Small ,
Jeff Rodelas ,
Erin Barrick ,
Ryan DeMott  and
Khalid Hattar
Kathryn Small
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Jeff Rodelas
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Erin Barrick
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Ryan DeMott
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Khalid Hattar*
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
*
*Corresponding author: khattar@sandia.gov

Abstract

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Type
In Situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1922 - 1923
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Copyright
Copyright © Microscopy Society of America 2022

References

Taheri, ML et al. , Microsc Res Tech 72(3) (2009), p. 122.10.1002/jemt.20664CrossRefGoogle Scholar
Wu, Y et al. , Microscopy and Microanalysis 24(6) (2018), p. 647.10.1017/S1431927618015465CrossRefGoogle Scholar
The authors would like to acknowledge Daniel Perry and Damion Cummings at Sandia National Laboratories for preparation of FIB lift-outs used in the above experiments. Shen Dillon and Keith Coffman are gratefully acknowledged for use of their strain calculation MATLAB code. This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE's National Nuclear Security Administration under contract DE-NA-0003525. The views expressed in the article do not necessarily represent the views of the U.S. DOE or the United States Government.Google Scholar