Hostname: page-component-5d59c44645-k78ct Total loading time: 0 Render date: 2024-02-23T13:47:09.441Z Has data issue: false hasContentIssue false

In-situ TEM and Spectroscopy Studies of Nanoscale Perpendicular Magnetic Tunnel Junction

Published online by Cambridge University Press:  22 July 2022

Hwanhui Yun*
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, United States
Deyuan Lyu
Affiliation:
Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, United States
Yang Lv
Affiliation:
Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, United States
Brandon R. Zink
Affiliation:
Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, United States
Pravin Khanal
Affiliation:
Department of Physics, University of Arizona, Tucson, AZ, United States
Bowei Zhou
Affiliation:
Department of Physics, University of Arizona, Tucson, AZ, United States
Weigang Wang
Affiliation:
Department of Physics, University of Arizona, Tucson, AZ, United States
Jian-Ping Wang
Affiliation:
Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, United States
K. Andre Mkhoyan*
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, United States
*
*Corresponding authors: yunxx133@umn.edu, mkhoyan@umn.edu
*Corresponding authors: yunxx133@umn.edu, mkhoyan@umn.edu

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
From Operando Microcell Experiments to Bulk Devices
Copyright
Copyright © Microscopy Society of America 2022

References

Cha, J. J. et al. , Appl. Phys. Lett. 91 (2007), 062516. DOI: 10.1063/1.2769753.CrossRefGoogle Scholar
Almasi, H. et al. , Appl. Phys. Lett. 106 (2015), 182406. DOI: 10.1063/1.4919873.CrossRefGoogle Scholar
Ikeda, S. et al. , Nat. Mater. 9 (2010), 721. DOI: 10.1063/5.0066782.CrossRefGoogle Scholar
Khanal, P. et al. , Appl. Phys. Lett. 119 (2021), 242404. DOI: 10.1038/nmat2804.CrossRefGoogle Scholar
Worledge, D. C. et al. , Appl. Phys. Lett. 98 (2011), 022501. DOI: 10.1063/1.3536482.CrossRefGoogle Scholar
Gajek, M. et al. , Appl. Phys. Lett. 100 (2012), 132408. DOI: 10.1063/1.3694270.CrossRefGoogle Scholar
The authors acknowledge funding from SMART, one of seven centers of nCore, a Semiconductor Research corporation program, sponsored by NIST and from Defence Advanced Research Projects Agency (DARPA) FRANC program. Portions of this work were conducted in the UMN Characterization Facility supported by the NSF through the UMN MRSEC and in the Minnesota Nano Center supported by the NSF through the NNCI.Google Scholar