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Expanding the Limits of Atom Probe Crystallographic Analysis

Published online by Cambridge University Press:  22 July 2022

Andrew J. Breen ,
Alec C. Day ,
Felix Theska ,
Bryan Lim ,
William Davids ,
Sophie Primig  and
Simon P. Ringer
Andrew J. Breen
Affiliation:
School of Aerospace, Mechanical and Mechatronic Engineering, and Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW, Australia
Alec C. Day
Affiliation:
School of Aerospace, Mechanical and Mechatronic Engineering, and Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW, Australia
Felix Theska
Affiliation:
School of Materials Science and Engineering, UNSW, Sydney, NSW, Australia
Bryan Lim
Affiliation:
School of Aerospace, Mechanical and Mechatronic Engineering, and Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW, Australia
William Davids
Affiliation:
School of Aerospace, Mechanical and Mechatronic Engineering, and Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW, Australia
Sophie Primig
Affiliation:
School of Materials Science and Engineering, UNSW, Sydney, NSW, Australia
Simon P. Ringer*
Affiliation:
School of Aerospace, Mechanical and Mechatronic Engineering, and Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW, Australia
*
*Corresponding author: simon.ringer@sydney.edu.au

Abstract

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Type
On Demand - Expanding the Limits of Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 756 - 758
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Copyright
Copyright © Microscopy Society of America 2022

References

Day, AC et al. , Microscopy and Microanalysis 25 (2019), p. 288–300. doi:10.1017/S1431927618015593.CrossRefGoogle Scholar
Breen, AJ et al. , Microscopy and Microanalysis 23 (2017), p. 279–290. doi:10.1017/S1431927616012605CrossRefGoogle Scholar
Moody, MP et al. , Ultramicroscopy 109 (2009), p. 815–824. doi:10.1016/j.ultramic.2009.03.016.CrossRefGoogle Scholar
Invizo 6000 - 3D Atom Probe, https://www.cameca.com/products/apt/invizo-6000 (accessed February 10, 2022).Google Scholar
Lim, B et al. , Additive Manufacturing 46 (2021), p. 102121. doi:10.1016/j.addma.2021.102121CrossRefGoogle Scholar