Hostname: page-component-8448b6f56d-tj2md Total loading time: 0 Render date: 2024-04-25T05:39:10.983Z Has data issue: false hasContentIssue false
  • English
  • Français

Event-based hyperspectral EELS: towards nanosecond temporal resolution

Published online by Cambridge University Press:  22 July 2022

Yves Auad ,
Michael Walls ,
Jean-Denis Blazit ,
Odile Stéphan ,
Luiz H. G. Tizei ,
Mathieu Kociak ,
Francisco de La Peña  and
Marcel Tencé
Yves Auad
Affiliation:
Laboratoire de Physique des Solides, Université Paris Saclay, Orsay, France
Michael Walls
Affiliation:
Laboratoire de Physique des Solides, Université Paris Saclay, Orsay, France
Jean-Denis Blazit
Affiliation:
Laboratoire de Physique des Solides, Université Paris Saclay, Orsay, France
Odile Stéphan
Affiliation:
Laboratoire de Physique des Solides, Université Paris Saclay, Orsay, France
Luiz H. G. Tizei
Affiliation:
Laboratoire de Physique des Solides, Université Paris Saclay, Orsay, France
Mathieu Kociak
Affiliation:
Laboratoire de Physique des Solides, Université Paris Saclay, Orsay, France
Francisco de La Peña
Affiliation:
Unité Matériaux et Transformations, Université de Lille, Lille, France
Marcel Tencé
Affiliation:
Laboratoire de Physique des Solides, Université Paris Saclay, Orsay, France

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2648 - 2649
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Egerton, R. F., Electron Energy-Loss Spectroscopy in the Electron Microscope, Springer, 2008.Google Scholar
Pennycook, S. J., The impact of STEM aberration correction on materials science, Ultramicroscopy, 2017.10.1016/j.ultramic.2017.03.020CrossRefGoogle ScholarPubMed
Ballabriga, R. et al. , Asic developments for radiation imaging applications: The Medipix and Timepix family, Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2017.10.1016/j.nima.2017.07.029CrossRefGoogle Scholar
Zobelli, A. et al. , Spatial and spectral dynamics in STEM hyperspectral imaging using random scan patterns, Ultramicroscopy, 2020.10.1016/j.ultramic.2019.112912CrossRefGoogle ScholarPubMed
Auad, Y. et al. Event-based hyperspectral EELS: towards nanosecond temporal resolution. arXiv preprint arXiv: 2110.01706. 2021.Google Scholar