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Enhancing Electron Computational Ghost Imaging Using Artificial Neural Networks

Published online by Cambridge University Press:  22 July 2022

Lorenzo Viani ,
Paolo Rosi ,
Enzo Rotunno ,
Stefano Frabboni ,
Roberto Balboni  and
Vincenzo Grillo
Lorenzo Viani
Affiliation:
Ph.D. School in Physics and Nanosciences, University of Modena and Reggio Emilia, Modena, Italy
Paolo Rosi
Affiliation:
Consiglio Nazionale delle Ricerche (CNR)-NANO, Modena, Italy
Enzo Rotunno*
Affiliation:
Consiglio Nazionale delle Ricerche (CNR)-NANO, Modena, Italy
Stefano Frabboni
Affiliation:
Department of Physics, University of Modena and Reggio Emilia, Modena, Italy
Roberto Balboni
Affiliation:
Consiglio Nazionale delle Ricerche (CNR)-IMM, Bologna, Italy
Vincenzo Grillo
Affiliation:
Consiglio Nazionale delle Ricerche (CNR)-NANO, Modena, Italy
*
*Corresponding author: enzo.rotunno@nano.cnr.it

Abstract

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Type
On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2242 - 2244
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Copyright
Copyright © Microscopy Society of America 2022

References

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