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Digital Image Processing in C++ in SEM Images

Published online by Cambridge University Press:  22 July 2022

Luis Esteban Ramirez Peña ,
Hector A. Calderon  and
Alin Andrai Carsteanu
Luis Esteban Ramirez Peña*
Affiliation:
Instituto Politécnico Nacional, Departamento de Física, ESFM, Zacatenco CDMX, Mexico
Hector A. Calderon
Affiliation:
Instituto Politécnico Nacional, Departamento de Física, ESFM, Zacatenco CDMX, Mexico
Alin Andrai Carsteanu
Affiliation:
Instituto Politécnico Nacional, Departamento de Matematicas, ESFM, Zacatenco CDMX, Mexico
*
*Corresponding author: lramirezp0305@ipn.mx

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2186 - 2188
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Copyright
Copyright © Microscopy Society of America 2022

Reference

References

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