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Developing Atomic-scale Understanding of Beam-sensitive Functional Materials

Published online by Cambridge University Press:  22 July 2022

Arashdeep Singh Thind ,
Rohan Mishra  and
Robert F. Klie
Arashdeep Singh Thind
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago, IL, United States Joint Center for Energy Storage Research (JCESR), Argonne National Laboratory, Lemont, IL, United States
Rohan Mishra
Affiliation:
Department of Mechanical Engineering & Materials Science, Washington University in St. Louis, St. Louis, MO, United States Institute of Materials Science & Engineering, Washington University in St. Louis, St. Louis MO, United States
Robert F. Klie
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago, IL, United States Joint Center for Energy Storage Research (JCESR), Argonne National Laboratory, Lemont, IL, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2536 - 2537
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Copyright
Copyright © Microscopy Society of America 2022

References

Morrell, MV et al. , ACS Applied Nano Materials 1 (2018), p. 6091.10.1021/acsanm.8b01298CrossRefGoogle Scholar
Thind, AS et al. , Advanced Materials 31 (2019), p. e1805047.10.1002/adma.201805047CrossRefGoogle Scholar
Yankovich, AB et al. , Nature Communications 5 (2014), p. 4155.10.1038/ncomms5155CrossRefGoogle Scholar
Krivanek, OL et al. , Ultramicroscopy 203 (2019), p. 60.10.1016/j.ultramic.2018.12.006CrossRefGoogle Scholar
Mishra, R et al. , MRS Bulletin 42 (2017), p. 644.10.1557/mrs.2017.187CrossRefGoogle Scholar
A portion of the microscopy research was performed as part of a user proposal at Oak Ridge National Laboratory's (ORNL) Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy (DOE), Office of Science User Facility. This work is supported by the Joint Center for Energy Storage Research (JCESR) and Energy Innovation Hub funded by the U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences. This work made use of instruments in the Electron Microscopy Service, specifically JEOL JEM-ARM200CF in the Research Resources Center, University of Illinois at Chicago.Google Scholar