Hostname: page-component-76fb5796d-dfsvx Total loading time: 0 Render date: 2024-04-26T04:41:31.142Z Has data issue: false hasContentIssue false

Deep-Ultra-Violet Atom-Probe Tomography Using Automation to Understand Operational Parameter Space: A Progress Report

Published online by Cambridge University Press:  22 July 2022

Ty J. Prosa*
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Dan Lenz
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Joe Bunton
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Nick Brewer
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Gard Groth
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
David A. Reinhard
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
David J. Larson
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
*
*Corresponding author: Ty.Prosa@Ametek.com

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Expanding the Limits of Atom Probe Tomography
Copyright
Copyright © Microscopy Society of America 2022

References

Miller, M. K. and Forbes, R. G., Atom-Probe Tomography: The Local Electrode Atom Probe, 1st ed. (Springer US, Boston, MA, 2014).10.1007/978-1-4899-7430-3CrossRefGoogle Scholar
Koelling, S. et al. , Ultramicroscopy 111 (2011), p. 540.10.1016/j.ultramic.2011.01.004CrossRefGoogle Scholar
Prosa, T. et al. , Microsc. Microanal. 27 (S1) (2021), p. 1262.10.1017/S1431927621004736CrossRefGoogle Scholar
Prosa, T. J. et al. , Microsc. Microanal. 25 (2019), p. 425.10.1017/S1431927618015258CrossRefGoogle Scholar
Kölling, S. and Vandervorst, W., Ultramicroscopy 109 (2009), p. 486.10.1016/j.ultramic.2008.11.013CrossRefGoogle Scholar