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Characterization and Optimization of OSTEM; A Novel Detection Method for Single- and Multi-Beam Scanning Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Arent Kievits ,
Job Fermie ,
Peter Duinkerken ,
Ryan Lane ,
Elizabeth Carroll ,
Ben Giepmans  and
Jacob Hoogenboom
Arent Kievits*
Affiliation:
Department of Imaging Physics, Delft University of Technology – Delft, Netherlands
Job Fermie
Affiliation:
Delmic B.V. - Delft, Netherlands
Peter Duinkerken
Affiliation:
Department of Cell Biology, University Medical Centre Groningen- Groningen, Netherlands
Ryan Lane
Affiliation:
Department of Imaging Physics, Delft University of Technology – Delft, Netherlands
Elizabeth Carroll
Affiliation:
Department of Imaging Physics, Delft University of Technology – Delft, Netherlands
Ben Giepmans
Affiliation:
Department of Cell Biology, University Medical Centre Groningen- Groningen, Netherlands
Jacob Hoogenboom
Affiliation:
Department of Imaging Physics, Delft University of Technology – Delft, Netherlands
*
*Corresponding author: A.J.Kievits@tudelft.nl

Abstract

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Type
3D Volume Electron Microscopy in Biology Research
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1458 - 1460
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Copyright
Copyright © Microscopy Society of America 2022

References

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