Hostname: page-component-848d4c4894-tn8tq Total loading time: 0 Render date: 2024-06-29T18:08:49.310Z Has data issue: false hasContentIssue false
  • English
  • Français

Carbon Capping for Specimen Preparation of Atom Probe Samples with Features of Interest Near the Surface

Published online by Cambridge University Press:  22 July 2022

Edwin Supple ,
Chomani Gaspe ,
Kevin J. Dwyer ,
Robert Butera ,
Christopher J. K. Richardson  and
Brian Gorman
Edwin Supple*
Affiliation:
Colorado School of Mines, Golden, CO, United States of America
Chomani Gaspe
Affiliation:
Laboratory for Physical Sciences, College Park, MD, United States
Kevin J. Dwyer
Affiliation:
Laboratory for Physical Sciences, College Park, MD, United States
Robert Butera
Affiliation:
Laboratory for Physical Sciences, College Park, MD, United States
Christopher J. K. Richardson
Affiliation:
Laboratory for Physical Sciences, College Park, MD, United States
Brian Gorman
Affiliation:
Colorado School of Mines, Golden, CO, United States of America
*
*Corresponding author: esupple@mines.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Expanding the Limits of Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 744 - 746
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Diercks, D. R., Gorman, B. P., and Mulders, J. J. L., “Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers,” Microsc. Microanal., vol. 23, no. 2, pp. 321–328, Apr. 2017, doi: 10.1017/S1431927616011740.CrossRefGoogle Scholar
Herbig, M. and Kumar, A., “Removal of hydrocarbon contamination and oxide films from atom probe specimens,” Microsc. Res. Tech., vol. 84, no. 2, pp. 291–297, 2021, doi: 10.1002/jemt.23587.CrossRefGoogle ScholarPubMed
Thompson, K., Lawrence, D., Larson, D. J., Olson, J. D., Kelly, T. F., and Gorman, B., “In situ site-specific specimen preparation for atom probe tomography,” Ultramicroscopy, vol. 107, no. 2, pp. 131–139, Feb. 2007, doi: 10.1016/j.ultramic.2006.06.008.CrossRefGoogle ScholarPubMed