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3D Atom Dynamics in Pt-NiO Nanocrystals
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions
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- Copyright
- Copyright © Microscopy Society of America 2022
References
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Chen, F.-R., Van Dyck, D., Kisielowski, C., Nature Commun. 7 (2016), p. 10603. doi: 10.1038/s41467-021-24857-4Google Scholar
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