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100,000 Diffraction Patterns per Second with Live Processing for 4D-STEM

Published online by Cambridge University Press:  22 July 2022

Benjamin Plotkin-Swing ,
Benedikt Haas ,
Andreas Mittelberger ,
Niklas Dellby ,
Michael Hotz ,
Petr Hrncirik ,
Chris Meyer ,
Pietro Zambon ,
Christoph Hoermann  and
Matthias Meffert
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Benjamin Plotkin-Swing*
Affiliation:
Nion Co. R&D, Kirkland, WA, USA
Benedikt Haas
Affiliation:
Department of Physics & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany
Andreas Mittelberger
Affiliation:
Nion Co. R&D, Kirkland, WA, USA
Niklas Dellby
Affiliation:
Nion Co. R&D, Kirkland, WA, USA
Michael Hotz
Affiliation:
Nion Co. R&D, Kirkland, WA, USA
Petr Hrncirik
Affiliation:
Nion Co. R&D, Kirkland, WA, USA
Chris Meyer
Affiliation:
Department of Physics & IRIS Adlershof, Humboldt-Universität zu Berlin, Berlin, Germany
Pietro Zambon
Affiliation:
DECTRIS Ltd., Baden-Daettwil, Switzerland
Christoph Hoermann
Affiliation:
DECTRIS Ltd., Baden-Daettwil, Switzerland
Matthias Meffert
Affiliation:
DECTRIS Ltd., Baden-Daettwil, Switzerland
Darya Bachevskaya
Affiliation:
DECTRIS Ltd., Baden-Daettwil, Switzerland
Luca Piazza
Affiliation:
DECTRIS Ltd., Baden-Daettwil, Switzerland
Ondrej L. Krivanek
Affiliation:
Nion Co. R&D, Kirkland, WA, USA Department of Physics, Arizona State University, Tempe AZ, USA
Tracy Clark Lovejoy
Affiliation:
Nion Co. R&D, Kirkland, WA, USA
*
*Corresponding author: plotkin-swing@nion.com

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 422 - 424
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Copyright
Copyright © Microscopy Society of America 2022

References

Ophus, C, Microsc. and Microanal. 25(3) (2019), p. 563.10.1017/S1431927619000497CrossRefGoogle Scholar
Plotkin-Swing, B et al. , Ultramicroscopy 217 (2020), p. 113067.10.1016/j.ultramic.2020.113067CrossRefGoogle Scholar
Meyer, C et al. , Micros. and Microanal. 20(S3) (2014), p. 1108.10.1017/S1431927614007272CrossRefGoogle Scholar
Haas, B et al. , Microsc. and Microanal. 27(S1) (2021), p. 994.10.1017/S1431927621003779CrossRefGoogle Scholar
Mittelberger, A et al. , Microsc. and Microanal. 27(S1) (2021), p. 1064.10.1017/S1431927621004013CrossRefGoogle Scholar
Bartolomé, J et al. , Nano Letters 17 (8) (2017), p. 4654.10.1021/acs.nanolett.7b01136CrossRefGoogle Scholar
Acknowledgements: We thank Lutz Geelhaar (Paul-Drude-Institut, Berlin) for the nanowire sample.Google Scholar