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The role of materials science after the Mexico City earthquakes in 1985
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- 31 January 2011, pp. 658-665
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Kinetic mechanisms for mullite formation from sol-gel precursors
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- 31 January 2011, pp. 1963-1969
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MASS-NMR structural analysis of barium aluminofluorophosphate glasses with and without nitridation
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- 31 January 2011, pp. 835-840
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Compressive behavior and deformation-mode map of an open cell aluminaa)
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- 31 January 2011, pp. 163-171
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The effect of Ag electrode processing on (Nb, Ba) doped TiO2 ceramics
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- 31 January 2011, pp. 1530-1537
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Structural and magnetic properties of random mixture graphite intercalation compounds
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- 31 January 2011, pp. 422-434
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Sol-gel preparation of amorphous ZBLA heavy metal fluoride powders
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- 31 January 2011, pp. 1092-1094
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Hole pattern formation in unfired ceramic sheets by pulsed Nd:YAG laser
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- 31 January 2011, pp. 841-846
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Interfacial energy states of moisture-exposed cracks in mica
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- 31 January 2011, pp. 172-182
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Controlled crystallization of vaterite from viscous solutions of organic colloids
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- 31 January 2011, pp. 2928-2932
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Rietveld powder structure refinement of Na2Al2Ti6O16; Comparison of synchrotron radiation and conventional x-ray tube datasets
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- 31 January 2011, pp. 1538-1543
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Sol-gel processing of cordierite: Effect of seeding and optimization of heat treatment
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- 31 January 2011, pp. 1095-1103
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Erratum
Erratum: “Crystallization kinetics of BaO–Al2O3–SiO2 glasses”. [J. Mater. Res. 4, 1257 (1989)]
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- 31 January 2011, p. 1781
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Commentaries and Reviews
Hydrogen-alkali-metal-graphite ternary intercalation compounds
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- 31 January 2011, pp. 435-466
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Articles
Adhesion and short-range forces between surfaces. Part II: Effects of surface lattice mismatch
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- 31 January 2011, pp. 2232-2243
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Ion beam mixing of La(OH)3/Cu bilayers
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- 31 January 2011, pp. 1970-1975
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Diamond and Diamond-Like Materials
Line shape analysis of the Raman spectrum of diamond films grown by hot-filament and microwave-plasma chemical vapor deposition
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- 31 January 2011, pp. 2456-2468
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Quantitative topographic analysis of fractal surfaces by scanning tunneling microscopy
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- 31 January 2011, pp. 2244-2254
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Commentaries and Reviews
Refractory semiconductor of boron phosphide
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- 31 January 2011, pp. 2933-2947
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Articles
Instrumentation of a conventional hardness tester for load-displacement measurement during indentation
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- 31 January 2011, pp. 847-851
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