9 results
Infrared ellipsometry and near-infrared-to-vacuum-ultraviolet ellipsometry study of free-charge carrier properties in In-polar p-type InN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1396 / 2012
- Published online by Cambridge University Press:
- 16 January 2012, mrsf11-1396-o07-27
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- 2012
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Spectroscopic Mapping Ellipsometry of Graphene Grown on 3C SiC
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1407 / 2012
- Published online by Cambridge University Press:
- 29 February 2012, mrsf11-1407-aa20-43
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- 2012
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Materials Characterization using THz Ellipsometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1163 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1163-K08-04
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- 2009
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Monitoring Organic Thin Film Growth In Aqueous Solution In-situ With A Combined Quartz Crystal Microbalance and Ellipsometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1146 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1146-NN09-02
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- 2008
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Terahertz Ellipsometry Using Electron-Beam Based Sources
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1108 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1108-A08-04
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- 2008
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Infrared behavior of aluminum nanostructure sculptured thin films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1080 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1080-O04-16
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- 2008
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Interface-charge-coupled polarization response model of Pt-BaTiO3-ZnO-Pt heterojunctions: Physical parameters variation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1074 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1074-I01-11
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- 2008
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Far-infrared dielectric function and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P
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- Journal:
- MRS Online Proceedings Library Archive / Volume 744 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, M5.33
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- 2002
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Far-infrared magnetooptical generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 744 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, M5.32
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- 2002
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