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Elementary Statistics for Public Administration
- An Applied Perspective
- Coming soon
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- Expected online publication date:
- September 2024
- Print publication:
- 30 September 2024
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- Textbook
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EDS Spectrometry at Low Accelerating Voltages: Pushing the Boundaries of Nano- and Light Element Analysis with Enhanced SDD Technology
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1064-1065
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- July 2012
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SDD-EDS: Element Analysis of Nanostructures in TEM
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1058-1059
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- July 2012
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Recent Developments in Silicon Drift Detector Technology: Atomic to mm Scale
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1170-1171
- Print publication:
- July 2011
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Chemical and Structural Analysis in 3D: Combining μ-XRF, EDS, and EBSD Data Sets
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1000-1001
- Print publication:
- July 2011
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From ensemble average to single (nano-) objects properties by X-ray microdiffraction: a short review on structure determination (local strain, composition, ...) and objects manipulation (AFM-coupled)*
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- Journal:
- Revue de Métallurgie – International Journal of Metallurgy / Volume 107 / Issue 10-11 / November 2010
- Published online by Cambridge University Press:
- 06 July 2011, pp. 433-439
- Print publication:
- November 2010
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High Count Rate Standardless and Standard-Based Quantification in EDS – Practical Limits and Root Causes for Deviations in the Result
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1314-1315
- Print publication:
- July 2010
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- Article
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Speed Limitations and Trade-off's for SEM/EDS Particle Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 590-591
- Print publication:
- August 2008
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