22 results
Live Measurement of Electrical Charge Density in Materials using Off-Axis Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 44-45
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- August 2019
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Towards Ptychography with Structured Illumination, and a Derivative-Based Reconstruction Algorithm
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 58-59
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- August 2019
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Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 512-513
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- July 2016
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Electron Energy-Loss Spectroscopy and Energy-Filtered TEM Imaging for thein situAssessment of Reduction-Oxidation Reactions in Ni-Based Solid Oxide Fuel Cells
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1328-1329
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- July 2016
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High Temperature Stability of Amorphous Zn-Sn-O Transparent Conductive Oxides Investigated byIn SituTEM and X-ray Diffraction
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1582-1583
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- July 2016
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Electric and Magnetic Field Mapping With the pnCCD (S)TEM Camera
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 256-257
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- July 2016
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Towards Mapping Electrostatic Potentials in Semiconductor Devices Under Working Conditions Using Off-Axis Electron Holography
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1358-1359
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- August 2013
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An Assessment of the Origin of Contrast in Off-Axis Electron Holographic Imaging of BaTiO3 Ferroelectric Domains
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1370-1371
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- August 2013
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Oxidation of Pseudo-Single Domain Fe3O4 Particles and Associated Magnetic Response Examined by Environmental TEM and Off-Axis Electron Holography
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1456-1457
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- August 2013
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In situ study of anode reaction in intermediate temperature solid oxide fuel cells
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 494-495
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- August 2013
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Electron Holography of Dipolar Magnetism in Self-assembled Nanoparticle Chains
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1374-1375
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- August 2013
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Nickel oxide reduction studied by environmental TEM and in situ XRD
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1176-1177
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- July 2012
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Simulations of the electrostatic potential in a thin silicon specimen containing a p-n junction
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- MRS Online Proceedings Library Archive / Volume 839 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, P3.2
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- 2004
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The Determination and Interpretation of Electrically Active Charge Density Profiles at Reverse Biased p-n Junctions from Electron Holograms
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 42-43
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- August 2002
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Quantitative Examination of Reverse-Biased Semiconductor Devices using Off- Axis Electron Holography
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 518-519
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- August 2002
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3d Reconstruction of Sub-Nm Beam Profiles in STEM
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
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- 02 July 2020, pp. 344-345
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- August 2001
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The Crystallography of Metal Halides formed within Single Walled Carbon Nanotubes
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- MRS Online Proceedings Library Archive / Volume 633 / 2000
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- 15 March 2011, A14.31
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- 2000
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Holography Measurement of Mean Inner Potential of Germanium
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 612-613
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- July 1998
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The Effect of Fe Layer Width on the Electron Structure of Ferromagnetic Face Centered Tetragonal Fe-Cu Multilayers
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
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- 02 July 2020, pp. 517-518
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- August 1997
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Characterization of Ultrathin Doping Layers in Semiconductors
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- Microscopy and Microanalysis / Volume 3 / Issue 4 / July 1997
- Published online by Cambridge University Press:
- 31 January 2003, pp. 352-363
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- July 1997
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