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Live Measurement of Electrical Charge Density in Materials using Off-Axis Electron Holography

Published online by Cambridge University Press:  05 August 2019

E. Voelkl ,
F. Zheng ,
V. Migunov ,
M. Beleggia  and
R.E. Dunin-Borkowski
E. Voelkl
Affiliation:
HoloWerk LLC, Austin, Texas
F. Zheng
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum JülichGmbH, Jülich, Germany
V. Migunov
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum JülichGmbH, Jülich, Germany Central Facility for Electron Microscopy, RWTH Aachen University, Aachen, Germany
M. Beleggia
Affiliation:
DTU Nanolab, Technical University of Denmark, Kgs. Lyngby, Denmark
R.E. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum JülichGmbH, Jülich, Germany

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 44 - 45
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Gabor, D., Nature 161(4098) (1948) 777–78.Google Scholar
[2]Voelkl, E., Microscopy Today, 2019 January, doi:10.1017/S1551929518001074.Google Scholar
[3]See http://www.gatan.com/Google Scholar
[4]Beleggia, M. et al. , Applied Physics Letters 98, 243101 (2011).Google Scholar
[5]Migunov, V. et al. , Journal of Applied Physics 117, 134301 (2015).Google Scholar
[6]Beleggia, M. et al. , 2016 J. Phys. D: Appl. Phys. 49, 294003.Google Scholar
[7]The authors acknowledge the European Union for funding through the Marie Curie Initial Training Network Grant No. 606988 under FP7-PEOPLE-2013-ITN).Google Scholar