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Growth and Characterization of Boron Nitride/Diamond Heterostructures
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 2830-2831
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- August 2022
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Incorporating Authentic Scientific Research and The Nature of Science Into the High School Classroom.
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- MRS Online Proceedings Library Archive / Volume 1364 / 2011
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- 25 July 2011, mrss11-1364-ss01-06
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- 2011
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Solid-State and Vacuum Thermionic Energy Conversion
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- MRS Online Proceedings Library Archive / Volume 886 / 2005
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- 01 February 2011, 0886-F07-01
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- 2005
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Micro-Raman Mapping and Analysis of Indentation-Induced Phase Transformations in Germanium
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- MRS Online Proceedings Library Archive / Volume 841 / 2004
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- 01 February 2011, R10.9T6.9
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- 2004
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Micro-Raman Mapping and Analysis of Indentation-Induced Phase Transformations in Germanium
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- MRS Online Proceedings Library Archive / Volume 843 / 2004
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- 01 February 2011, T6.9/R10.9
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- 2004
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Wavelength-dependent Raman scattering of hydrogenated amorphous silicon carbon with red, green, and blue light excitation
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- Journal of Materials Research / Volume 18 / Issue 4 / April 2003
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- 06 January 2012, pp. 768-771
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- April 2003
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Optical Characterization of High Quality GaN Produced by High Rate Magnetron Sputter Epitaxy
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- MRS Online Proceedings Library Archive / Volume 743 / 2002
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- 11 February 2011, L4.12
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- 2002
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Measurement of the Effective Piezoelectric Constant of Nitride Thin Films and Heterostructures Using Scanning Force Microscopy
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- MRS Online Proceedings Library Archive / Volume 693 / 2001
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- 21 March 2011, I9.9.1
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- 2001
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Chemical, Electrical, and Structural Properties of Au/Pd Contacts on Chemical Vapor Cleaned p-type GaN Surfaces
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- MRS Online Proceedings Library Archive / Volume 693 / 2001
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- 21 March 2011, I11.40.1
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- 2001
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Wafer Bonding of Silicon Carbide and Gallium Nitride
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- MRS Online Proceedings Library Archive / Volume 681 / 2001
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- 21 March 2011, I2.4
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- 2001
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An optimized process for fabrication of SrBi2Ta2O9 thin films using a novel chemical solution deposition technique
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- Journal of Materials Research / Volume 14 / Issue 11 / November 1999
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- 31 January 2011, pp. 4395-4401
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- November 1999
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Electrical Properties of Nanoscale Tisi2 Islands on Si
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- MRS Online Proceedings Library Archive / Volume 583 / 1999
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- 10 February 2011, 111
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- 1999
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Real-Time Observation of Pt-Si Micro-Droplet Migration by Photo-Electron Emission Microscopy
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- MRS Online Proceedings Library Archive / Volume 584 / 1999
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- 10 February 2011, 201
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- 1999
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Reduction of The Phase Transition Temperature of TiSi2 on Si(111) Using a Ta Interlayer
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- MRS Online Proceedings Library Archive / Volume 564 / 1999
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- 10 February 2011, 59
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- 1999
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Stress Relaxation in Uniquely Oriented SiGe/Si Epitaxial Layers
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- MRS Online Proceedings Library Archive / Volume 594 / 1999
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- 10 February 2011, 163
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- 1999
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Tem Investigation of Co-Si Thin Films on S1-xGex/Si
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 630-631
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- July 1998
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Electron Emission Properties of Diamond and III-V Nitrides
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- MRS Online Proceedings Library Archive / Volume 509 / 1998
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- 10 February 2011, 35
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- 1998
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Real-Time Observation of Ti Silicide Epitaxial Islands Growth with the Photoelectron Emission Microscopy
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- MRS Online Proceedings Library Archive / Volume 533 / 1998
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- 10 February 2011, 197
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- 1998
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Thickness Effects in the Reaction of Cobalt with Slicon-Germanium Alloys
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- MRS Online Proceedings Library Archive / Volume 514 / 1998
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- 10 February 2011, 165
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- 1998
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Piezoelectric Measurements with Atomic Force Microscopy
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- MRS Online Proceedings Library Archive / Volume 541 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 617
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- 1998
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