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Formation of amorphous xenon nanoclusters and microstructure evolution in pulsed laser deposited Ti62.5Si37.5 thin films during Xe ion irradiation
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- Journal of Materials Research / Volume 26 / Issue 1 / 14 January 2011
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- 14 January 2011, pp. 62-69
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- 14 January 2011
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Development and Application of an Internet Electron Microscopy System for the Outreach Program in Japan
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- Microscopy and Microanalysis / Volume 14 / Issue 2 / April 2008
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- 03 March 2008, pp. 176-183
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- April 2008
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TEM Sample Preparation Using a New Nanofabrication Technique Combining Electron-Beam-Induced Deposition and Low-Energy Ion Milling
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- Microscopy and Microanalysis / Volume 12 / Issue 6 / December 2006
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- 11 October 2006, pp. 545-548
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- December 2006
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Dynamic Monte Carlo Simulation on the Electron-Beam-Induced Deposition of Carbon, Silver, and Tungsten Supertips
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- Microscopy and Microanalysis / Volume 12 / Issue 6 / December 2006
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- 11 October 2006, pp. 549-552
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- December 2006
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Ultrahigh-Vacuum Third-Order Spherical Aberration (Cs) Corrector for a Scanning Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 12 / Issue 6 / December 2006
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- 11 October 2006, pp. 456-460
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- December 2006
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Transmission Electron Microscopy of Martensitic Transformation in Xe-implanted Austenitic 304 Stainless Steel
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- Journal of Materials Research / Volume 20 / Issue 7 / July 2005
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- 01 July 2005, pp. 1751-1757
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- July 2005
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Public Opened Internet Electron Microscopy in Educational Field
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 1566-1567
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- August 2004
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Electron Beam Induced Depositions of Nano-dots by the Presence of the Partial Pressure of Precursor
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 540-541
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- August 2004
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Reduction of Surface Oxide Films in Al–Mg Alloy Powders by Pulse Electric Current Sintering
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- Journal of Materials Research / Volume 19 / Issue 3 / March 2004
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- 03 March 2011, pp. 815-819
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- March 2004
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Direct UHV-TEM Observation of Palladium Clusters on a Silicon Surface
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- Microscopy and Microanalysis / Volume 10 / Issue 1 / February 2004
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- 22 January 2004, pp. 134-138
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- February 2004
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Interfaces of Xe Clusters with Al --- Displacement of Atomic Positions of Crystalline Xe and Ordering in a Fluid Xe Confined by Flat Surfaces
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- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
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- 05 September 2003, pp. 290-291
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- September 2003
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Xe Precipitates in Aluminum
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- MRS Online Proceedings Library Archive / Volume 792 / 2003
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- 01 February 2011, R10.1
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- 2003
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Energy Loss Spectroscopy and Electron Microscopy of Photoluminescent p-type Porous Silicon Treated with NaOH and NH3 Solutions
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 332-333
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- August 2002
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Structural and Spectroscopic Study of Manganese Silicide Islands on Silicon
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- MRS Online Proceedings Library Archive / Volume 704 / 2001
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- 17 March 2011, W9.8.1
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- 2001
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Effect of the Pretreatment Step Condition in the Growth Process of the Si Melt Method on the Size of β–Si3N4 Single Crystals
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- Journal of Materials Research / Volume 15 / Issue 8 / August 2000
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- 31 January 2011, pp. 1803-1810
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- August 2000
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Structural Fluctuations in Metal Nanoparticles
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
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- 02 July 2020, pp. 718-719
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- August 1999
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Focused Ion Beam Interfaced with a 200 keV Transmission Electron Microscope for In Situ Micropatterning on Semiconductors
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- Microscopy and Microanalysis / Volume 4 / Issue 3 / June 1998
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- 28 July 2005, pp. 207-217
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- June 1998
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Microstructural Observation of Focused Ion Beam Modification of Ni Silicide/Si Thin Films
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- MRS Online Proceedings Library Archive / Volume 439 / 1996
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- 15 February 2011, 227
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- 1996
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High Resolution Transmission Electron Microscopy of Defect Clusters in Aluminum During Electron and Ion Irradiation at Room Temperature
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- MRS Online Proceedings Library Archive / Volume 439 / 1996
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- 15 February 2011, 331
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- 1996
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Microstructural Observation of Focused Ion Beam Modification of Ni Silicide/Si Thin Films
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- MRS Online Proceedings Library Archive / Volume 438 / 1996
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- 03 September 2012, 313
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- 1996
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