10 results
Orientation Mapping by Electron Channeling (OMEC) and Hybrid Stage/Beam-Rocked Electron Channeling Patterns
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 634-635
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- August 2018
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Increasing the Speed of EELS/EDS Mapping Through Dynamic/Adaptive Sampling Methodologies
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 484-485
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- August 2018
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Inpainting Assisted Controlled Rotation Tomography (CORT)
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 502-503
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- August 2018
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High Speed/Low Dose Analytical Electron Microscopy with Machine Learning and Multi-Objective Dynamic Sampling
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1954-1955
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- August 2018
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Investigation of Electron Beam Deposition Parameters Within a Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 278-279
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- August 2018
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Orientation Mapping by Electron Channeling (OMEC) of Polycrystals Using a Stage-Rocked Big-Data Approach
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 584-585
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- August 2018
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Measuring the Autocorrelation Function of Nanoscale Three-Dimensional Density Distribution in Individual Cells Using Scanning Transmission Electron Microscopy, Atomic Force Microscopy, and a New Deconvolution Algorithm
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 3 / June 2017
- Published online by Cambridge University Press:
- 18 April 2017, pp. 661-667
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- June 2017
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Suppressing Electron Exposure Artifacts: An Electron Scanning Paradigm with Bayesian Machine Learning
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- Microscopy and Microanalysis / Volume 22 / Issue 4 / August 2016
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- 26 July 2016, pp. 778-788
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- August 2016
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Self–Organizing Neural Networks: Parallels Between “Big Imaging” and Sparse Imaging in Electron Microscopy
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 534-535
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- July 2016
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Reducing Electron Dose and Sample Damage with Bayesian Machine Learning and Self-Organizing Neural Networks
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1434-1435
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- July 2016
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