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Probing the Intrinsic Bending Stiffness of 2D Multilayers and Heterostructures Using Aberration-corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1632-1634
- Print publication:
- August 2020
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- Article
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Probing The Mechanical Properties of Few-Layer Graphene with Aberration-Corrected, Low-Voltage STEM
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1730-1731
- Print publication:
- August 2019
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- Article
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