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Probing the Intrinsic Bending Stiffness of 2D Multilayers and Heterostructures Using Aberration-corrected STEM

Published online by Cambridge University Press:  30 July 2020

Edmund Han
Affiliation:
University of Illinois at Urbana-Champaign, Champaign, Illinois, United States
Jaehyung Yu
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Mohammad Houssain
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Kenji Watanabe
Affiliation:
National Institute for Materials Science, Tsukuba, Ibaraki, Japan
Takashi Taniguchi
Affiliation:
National Institute for Materials Science, Tsukuba, Ibaraki, Japan
Elif Ertekin
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Arend van der Zande
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Pinshane Huang
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States

Abstract

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Type
New Frontiers in Electron Microscopy of Two-dimensional Materials
Copyright
Copyright © Microscopy Society of America 2020

References

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Han, E. and Yu, J., et al. Nature Materials (2019). doi: 10.1038/s41563-019-0529-7Google Scholar
This work was supported by NSF-MRSEC award no. DMR-1720633 and the Materials Research Laboratory Central Facilities at the University of Illinois.Google Scholar