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AFM Integrated with SEM/FIB for Complete 3D Metrology Measurements
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1433-1434
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- August 2015
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AFM Integrated with SEM/FIB for Complete 3D Metrology Measurements
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1112-1113
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- August 2014
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AFM Integrated with SEM and FIB: A Synergistic Union
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- Journal:
- Microscopy Today / Volume 21 / Issue 6 / November 2013
- Published online by Cambridge University Press:
- 05 November 2013, pp. 26-31
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- November 2013
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On-line Scanned Probe Microscopy Transparently Integrated with Dual Beam SEM/FIB Systems
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 640-641
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- July 2012
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On-Line Scanned Probe Microscopy Transparently Integrated with Twin SEM/FIB Systems
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 872-873
- Print publication:
- July 2011
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