5 results
Time of Flight Mass Spectroscopy of Recoiled Ions Studies of Gallium Nitride Thin Film Deposition by Various Molecular Beam Epitaxial Methods
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 3 / 1998
- Published online by Cambridge University Press:
- 13 June 2014, e22
- Print publication:
- 1998
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- Article
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Stress Effects in 2d Arsenic Diffusion in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 405 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 345
- Print publication:
- 1995
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Surface Effects in Silicon Doping with Boron During Proximity Rapid Thermal Diffusion
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- Journal:
- MRS Online Proceedings Library Archive / Volume 405 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 351
- Print publication:
- 1995
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Boron Doping using Proximity Rapid Thermal Diffusion from Spin-on-Dopants
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- Journal:
- MRS Online Proceedings Library Archive / Volume 342 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 369
- Print publication:
- 1994
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Investigation of Proximity Rtd for Submicron Junctions in Vlsi Si Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 303 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 297
- Print publication:
- 1993
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