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Rapid EDS Element Images for Image Analysis – A New Application of the XFlash® X-ray Detector Technology at the Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 1044-1045
- Print publication:
- August 2003
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- Article
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Real Time Color Scans with Scanning Electron Microscopes – A New Application of the XFlash® X-ray Detector Technology
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 84-85
- Print publication:
- August 2002
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- Article
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- You have access
- Export citation