Hostname: page-component-5c6d5d7d68-sv6ng Total loading time: 0 Render date: 2024-08-06T11:14:41.234Z Has data issue: false hasContentIssue false
  • English
  • Français

Rapid EDS Element Images for Image Analysis – A New Application of the XFlash® X-ray Detector Technology at the Scanning Electron Microscope

Published online by Cambridge University Press:  24 July 2003

Gabriele Mäurer ,
Gert Kommichau  and
Thomas Schülein
Gabriele Mäurer
Affiliation:
RÖNTEC GmbH, Schwarzschildstr. 12, D-12489 Berlin, Germany
Gert Kommichau
Affiliation:
RÖNTEC GmbH, Schwarzschildstr. 12, D-12489 Berlin, Germany
Thomas Schülein
Affiliation:
RÖNTEC GmbH, Schwarzschildstr. 12, D-12489 Berlin, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1044 - 1045
Copyright
Copyright © Microscopy Society of America 2003