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Aluminum oxide free-standing thin films to enable nitrogen edge soft x-ray scattering
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- Journal:
- MRS Communications / Volume 9 / Issue 1 / March 2019
- Published online by Cambridge University Press:
- 17 September 2018, pp. 224-228
- Print publication:
- March 2019
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Characterization of Erbium Doped SiO2 Layers Formed On Silicon By Spark Processing
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- Journal:
- MRS Online Proceedings Library Archive / Volume 486 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 281
- Print publication:
- 1997
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