2 results
Dependences of Structural Parameters on the Characteristics of Poly-Si Thin-Film Transistors after Plasma Passivation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 762 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, A18.8
- Print publication:
- 2003
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- Article
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Low Temperature (850 °C) Two-Step N2O Annealed Thin Gate Oxides
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- Journal:
- MRS Online Proceedings Library Archive / Volume 428 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 405
- Print publication:
- 1996
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- Article
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