3 results
Study of Back-Channel Defect States on Bottom-Gate IGZO TFTs Using Capacitance-Voltage Analysis
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1731 / 2015
- Published online by Cambridge University Press:
- 23 February 2015, mrsf14-1731-o08-03
- Print publication:
- 2015
-
- Article
- Export citation
Passivation and Annealing for Improved Stability of High Performance IGZO TFTs
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1692 / 2014
- Published online by Cambridge University Press:
- 14 October 2014, mrss14-1692-cc12-02
- Print publication:
- 2014
-
- Article
- Export citation
Crystallization of Amorphous Silicon and Dopant Activation using Xenon Flash-Lamp Annealing (FLA)
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1666 / 2014
- Published online by Cambridge University Press:
- 21 July 2014, mrss14-1666-a17-05
- Print publication:
- 2014
-
- Article
- Export citation