7 results
Dopant Activation in bulk germanium and Germanium-on-Insulator
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- Journal:
- MRS Online Proceedings Library Archive / Volume 829 / 2004
- Published online by Cambridge University Press:
- 26 February 2011, B9.18
- Print publication:
- 2004
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Sub-Nanosecond Detection of Heavy Ions Using Single-Crystal, Natural Type IIA Diamond
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- Journal:
- MRS Online Proceedings Library Archive / Volume 302 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 305
- Print publication:
- 1993
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Point Defect Detector Studies of Oxidized Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 238 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 101
- Print publication:
- 1991
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The Effect of Implant Species on the Stability of Ion Implantation Damage
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- Journal:
- MRS Online Proceedings Library Archive / Volume 100 / 1988
- Published online by Cambridge University Press:
- 26 February 2011, 277
- Print publication:
- 1988
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Nitrogen Contamination in Simox Wafer
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- Journal:
- MRS Online Proceedings Library Archive / Volume 107 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 111
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- 1987
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Defect Structures Generated by Buried Amorphous Layer Regrowth in <100> Arsenic Implanted Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 71 / 1986
- Published online by Cambridge University Press:
- 28 February 2011, 173
- Print publication:
- 1986
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Role of Implant Energy on Defect Structures for Phosphorus Implanted Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 71 / 1986
- Published online by Cambridge University Press:
- 28 February 2011, 191
- Print publication:
- 1986
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