6 results
Non Destructive Determination of the Threading Dislocation Density of Smooth Simox Substrates using Atomic Force Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1088-1089
- Print publication:
- August 2000
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Characterization of Plated Cu Thin Film Microstructures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 562 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 209
- Print publication:
- 1999
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Characterization of Plated Cu Thin Film Microstructures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 564 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 373
- Print publication:
- 1999
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Preparation of Tem Plan View Sections on Specific Devices Using the Tripod Polisher
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- Journal:
- MRS Online Proceedings Library Archive / Volume 523 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 19
- Print publication:
- 1998
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A Procedure for Cross Sectioning Specific Semiconductor Devices for Both SEM and TEM Analysis
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- Journal:
- MRS Online Proceedings Library Archive / Volume 199 / 1990
- Published online by Cambridge University Press:
- 16 February 2011, 189
- Print publication:
- 1990
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A Grinding/Polishing Tool for TEM Sample Preparation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 115 / 1987
- Published online by Cambridge University Press:
- 21 February 2011, 179
- Print publication:
- 1987
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