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Aberration-Corrected TEM Study of Defects in III-V Films Grown on Si
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1338-1339
- Print publication:
- July 2010
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- Article
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The source double-point cycle of a finite map of codimension one
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- Book:
- Complex Projective Geometry
- Published online:
- 06 July 2010
- Print publication:
- 30 July 1992, pp 199-212
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