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Aberration-Corrected TEM Study of Defects in III-V Films Grown on Si

Published online by Cambridge University Press:  01 August 2010

SH Vajargah ,
M Couillard ,
Y Shao ,
S Tavakoli ,
R Kleiman ,
J Preston  and
GA Botton
SH Vajargah
Affiliation:
McMaster University, Canada
M Couillard
Affiliation:
McMaster University, Canada
Y Shao
Affiliation:
McMaster University, Canada
S Tavakoli
Affiliation:
McMaster University, Canada
R Kleiman
Affiliation:
McMaster University, Canada
J Preston
Affiliation:
McMaster University, Canada
GA Botton
Affiliation:
McMaster University, Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1338 - 1339
Copyright
Copyright © Microscopy Society of America 2010