18 results
NanoMi Open Source (S)TEM Platform: Initial SEM Implementation
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1062-1063
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- August 2021
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Radiation Damage and Nanofabrication in TEM and STEM
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- Journal:
- Microscopy Today / Volume 29 / Issue 3 / May 2021
- Published online by Cambridge University Press:
- 21 May 2021, pp. 56-59
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- May 2021
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Properties of Dipole-Mode Vibrational Energy Losses Recorded From a TEM Specimen
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- Microscopy and Microanalysis / Volume 26 / Issue 6 / December 2020
- Published online by Cambridge University Press:
- 01 September 2020, pp. 1117-1123
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- December 2020
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Understanding Radiation Damage in Beam-Sensitive TEM Specimens
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 84-86
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- August 2020
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Evaluation of Confocal X-ray Analysis for Single-Atom Detection in a Thin Specimen by an Advanced Analytical Electron Microscope
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1512-1514
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- August 2020
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NanoMi: An Open Source (Scanning) Transmission Electron Microscope.
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1810-1811
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- August 2020
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Toward Quantitative Bright Field TEM Imaging of Ultra Thin Samples
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1612-1613
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- August 2018
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Advances in Atomic-resolution and Molecular-detection EELS
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1028-1029
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- July 2017
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Hole-Free Phase Plate Energy Filtering Imaging of Graphene: Toward Quantitative Hole-Free Phase Plate Imaging in a TEM
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 842-843
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- July 2017
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Electron Beam-Induced Charging and Modifications of Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1385-1388
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- August 2015
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Artefacts Induced on Soft Layer of Hybrid Metallic Nanoparticles in TEM
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1551-1552
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- August 2015
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Electron Diffraction Based Tilt Angle Measurements in Electron Tomography
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 806-807
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- August 2014
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Charging of Thin Film Phase Plates under Electron Beam Irradiation
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 230-231
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- August 2014
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Angle-resolved Valence EELS of a Single Crystal Gold Sample
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 628-629
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- August 2014
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A Modest Proposal for the Propagation of Information Concerning Radiation Damage in the TEM, and as Fodder for Pasturized Professors
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- Journal:
- Microscopy Today / Volume 21 / Issue 6 / November 2013
- Published online by Cambridge University Press:
- 05 November 2013, pp. 70-72
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- November 2013
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Impact Factor, My Donkey!
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- Journal:
- Microscopy Today / Volume 18 / Issue 1 / January 2010
- Published online by Cambridge University Press:
- 28 January 2010, p. 68
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- January 2010
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The Lateral Range and Energy Deposition of Fast Secondary Electrons
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1382-1383
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- August 2004
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K-Factor Standards for Low-Z Quantification
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 230-231
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- July 1998
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